$tem diffraction pattern analysis software$

Uses for 4D STEM dataīelow are a few examples of applications of 4D STEM in material science. Availability of high-speed, high-sensitivity, and high-dynamic-range detectors (including direct electron detectors) along with advances and availability of computational power, enable large-scale 4D experiments in the recent years. These multi-value detectors are usually annular as well, have 4 to 16 segments, and are used for differential measurements (see differential phase-contrast section).Ī generalized multi-value detector is the pixelated STEM detector (e.g., cameras). The simplest of these are quadrant detectors, but many other types of segmented detectors exist. Beyond single-value detectors, are classes of multi-value (more than one signal is detected per probe position) detectors. Note: Angles above are based on a 200 kV, non-corrected STEM and Individual set up values may vary. Bright-field (BF): Collects the intensities of the unscattered direct beam (collection angle 50 mrads).Scanning electron Nanodiffraction or nanobeam electron diffraction (NBED): Usually when a nanometer-scale beam is usedĬonventional STEM detectors usually have an annular geometry and record a single value per probe position:.Momentum-resolved STEM: Another name for 4D STEM, because it allows for evaluation and combination of real- and momentum space information, simultaneously.Spatially resolved diffractometry: Highlighting virtual imaging application.Position resolved diffraction (PRD): Used in earlier works where a 2D scan was used instead of only a line scan.Convergent beam electron diffraction (CBED)Īnd some other terms in the literature that refer to a 4D STEM technique:.Several terms have been used in the literature referring to electron diffraction patterns produced using a converged (STEM) probe: Virtual imaging Orientation mapping Strain mapping Differential phase contrast

$tem diffraction pattern analysis software$

Tem diffraction pattern analysis software